Atomic Scale Characterization of Supported and Assembled...

MRS Proceedings 2000 / 1 Vol. 634

Atomic Scale Characterization of Supported and Assembled Nanoparticles

Pauwels, B., Yandouzi, M., Schryvers, D., Tendeloo, G. Van, Verschoren, G., Lievens, P., Hou, M., Swygenhoven, H. Van
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Volume:
634
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-634-b8.3.1
Date:
January, 2000
File:
PDF, 2.91 MB
english, 2000
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