Fluctuation Microscopy Studies of Medium-range Order...

MRS Proceedings 2000 / 1 Vol. 638

Fluctuation Microscopy Studies of Medium-range Order Structures in Amorphous Tetrahedral Semiconductors

Chen, Xidong, Gibson, J. Murray, Sullivan, John, Friedmann, Tom, Voyles, Paul
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Volume:
638
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-638-f14.40.1
Date:
January, 2000
File:
PDF, 59 KB
english, 2000
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