Ion-implantation Generated Nanovoids in Si and MgO...

MRS Proceedings 2000 / 1 Vol. 650

Ion-implantation Generated Nanovoids in Si and MgO Monitored by High Resolution Positron Beam Analysis

Eijt, S.W.H., Falub, C.V., van Veen, A., Schut, H., Mijnarends, P.E., van Huis, M.A., Fedorov, A.V.

How much do you like this book?

What’s the quality of the file?

Download the book for quality assessment

What’s the quality of the downloaded files?

Volume:

650

Language:

english

Journal:

MRS Proceedings

DOI:

10.1557/proc-650-r9.11/o14.11

Date:

January, 2000

File:

PDF, 318 KB

english, 2000

Conversion to is in progress

Conversion to is failed