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Dielectric Properties Analysis in Paraelectric ZrTiO4 Thin Films
Kim, Kyunghae, Heo, Jinhee, Kim, Taeseok, Park, Byungwoo, Yi, JunsinVolume:
666
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-666-f3.7
Date:
January, 2001
File:
PDF, 71 KB
english, 2001