Thickness-fringe Contrast Analysis of Defects in GaN

MRS Proceedings 2001 / 1 Vol. 673

Thickness-fringe Contrast Analysis of Defects in GaN

Farrer, Jeffrey K., Carter, C. Barry, Mao, Z., McKernan, Stuart
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Volume:
673
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-673-p3.12
Date:
January, 2001
File:
PDF, 305 KB
english, 2001
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