Misfit Dislocations in Epitaxial Ni/Cu Bilayer and Cu/Ni/Cu Trilayer Thin Films
Yamamoto, Tadashi, Misra, Amit, Hoagland, Richard G., Nastasi, Mike, Kung, Harriet, Hirth, John P.Volume:
673
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-673-p7.1
Date:
January, 2001
File:
PDF, 1.01 MB
english, 2001