Fourier Transform Photoluminescence Analysis of Trace...

Fourier Transform Photoluminescence Analysis of Trace Impurities and Defects in Silicon

Duncan, W. M., Eastwood, M. L., Tsai, H-L.
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Volume:
69
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-69-225
Date:
January, 1986
File:
PDF, 316 KB
english, 1986
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