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Interdiffusion in Exchange Biased NiFe/IrMn/CoFe Electrode in Magnetic Tunnel Junctions
Lee, Jay H., Jeong, Hee D., Rho, Il C., Yoon, Chong S., Kim, Chang K.Volume:
690
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-690-f3.9
Date:
January, 2001
File:
PDF, 188 KB
english, 2001