Helical-Type Surface Defects in GaN and InGaN Thin Films Epitaxially Grown on GaN Templates at Reduced Temperatures
Miraglia, Peter, Preble, Edward, Roskowski, Amy, Einfeldt, Sven, Davis, Robert F.Volume:
693
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-693-i9.7.1
Date:
January, 2001
File:
PDF, 504 KB
english, 2001