In-situ surface x-ray scattering study on the buried...

MRS Proceedings 2001 / 1 Vol. 696

In-situ surface x-ray scattering study on the buried interfacial layer of Co/Si(111) interface

Kang, Tae Soo, Je, Jung Ho, Kim, Hyo Jung, Noh, Do Young, Kim, Nam Dong, Chung, Jin Wook

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Volume:

696

Language:

english

Journal:

MRS Proceedings

DOI:

10.1557/proc-696-n3.27

Date:

January, 2001

File:

PDF, 89 KB

english, 2001

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