Cross-sectional phase analysis of single crystalline...

MRS Proceedings 2001 / 1 Vol. 697

Cross-sectional phase analysis of single crystalline silicon indented by Rockwell indenter

Kim, Sung-Soon, Oh, Han-Seog, Jeong, Seong-Min, Lee, Hong-Lim
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Volume:
697
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-697-p8.6
Date:
January, 2001
File:
PDF, 1.54 MB
english, 2001
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