Four Current Examples of Characterization of Silicon Carbide
Bai, S., Ke, Yue, Shishkin, Y., Shigiltchoff, O., Devaty, R. P., Choyke, W. J., Strauch, D., Stojetz, B., Dorner, B., Hobgood, D., Serrano, J., Cardona, M., Nagasawa, H., Kimoto, T., Porter, L. M.Volume:
742
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-742-k3.1
Date:
January, 2002
File:
PDF, 983 KB
english, 2002