Far-infrared magnetooptical generalized ellipsometry...

MRS Proceedings 2002 / 1 Vol. 744

Far-infrared magnetooptical generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures

Hofmann, Tino, Grundmann, Marius, Herzinger, Craig M., Schubert, Mathias, Grill, Wolfgang
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Volume:
744
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-744-m5.32
Date:
January, 2002
File:
PDF, 151 KB
english, 2002
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