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Physical and Electrical Characterization of Hafnium Silicate Thin Films
Lysaght, Patrick S., Foran, Brendan, Bersuker, Gennadi, Larson, Larry, Murto, Robert W., Huff, Howard R.Volume:
747
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-747-t6.3/n8.3
Date:
January, 2002
File:
PDF, 981 KB
english, 2002