![](/img/cover-not-exists.png)
Ferroelectric Oxide Single-Crystalline Layers by Wafer Bonding and Hydrogen/Helium Implantation
Radu, Ionut, Szafraniak, Izabela, Scholz, Roland, Alexe, Marin, Gösele, UlrichVolume:
748
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-748-u11.8
Date:
January, 2002
File:
PDF, 244 KB
english, 2002