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Development of In-Situ Surface Observation System with an Atomic Resolution under Tensile Stress by Atomic Force Microscope
Matsumuro, Akihito, Kayukawa, Kimiharu, Fujimoto, Youhei, Ando, Taeko, Sato, KazuoVolume:
750
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-750-y8.5
Date:
January, 2002
File:
PDF, 438 KB
english, 2002