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AFM-based Electrical Characterization of Nano-structures
Biswas, Sujit K., Schujman, Sandra B., Vajtai, Robert, Wei, Bingqing, Parker, Allen, Schowalter, Leo J., Ajayan, Pulickel M.Volume:
761
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-761-nn6.2/g9.2
Date:
January, 2002
File:
PDF, 1.77 MB
english, 2002