Electrical Characterization of Vacuum Deposited and...

MRS Proceedings 2003 / 1 Vol. 771

Electrical Characterization of Vacuum Deposited and Solution Processed DH4T Thin Film Transistors

Muck, Tobias, Leufgen, Michael, Lebib, Amira, Borzenko, Tanja, Geurts, Jean, Schmidt, Georg, Molenkamp, Laurens W., Wagner, Veit, Gomes, Henrique L.
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Volume:
771
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-771-l10.3
Date:
January, 2003
File:
PDF, 233 KB
english, 2003
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