Characterization of polycrystalline Si silicon sheet grown...

Characterization of polycrystalline Si silicon sheet grown by die casting combined with the Bridgman technique

Saito, K., Iida, T., Akimoto, D., Nose, A., Takanashi, Y., Sakuragi, S., Nanba, H., Sakuragi, G., Shimazaki, T.
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Volume:
836
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-836-l5.45
Date:
January, 2004
File:
PDF, 22.14 MB
english, 2004
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