Grazing Incidence X-ray Scattering Study of Defect...

Grazing Incidence X-ray Scattering Study of Defect Structures in MBE GaAs/Si Using Synchrotron Radiation

Laderman, S. S., Kortright, J., Scott, M., Fischer-Colbrie, A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
91
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-91-143
Date:
January, 1987
File:
PDF, 384 KB
english, 1987
Conversion to is in progress
Conversion to is failed