Fault prognostic of electronics based on optimal multi-order particle filter
Jiang, Yuanyuan, Wang, Youren, Wu, Yi, Sun, QuanLanguage:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.03.030
Date:
April, 2016
File:
PDF, 1.61 MB
english, 2016