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[IEEE 2016 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2016.3.13-2016.3.14)] 2016 China Semiconductor Technology International Conference (CSTIC) - Resolving plasma induced damage for a CMOS embedded-OTP technology
Duan, Xiaobo, Chien, Wei-Ting Kary, Zhang, Dennis, Yu, Susie, Zhao, Daniel, Niu, JavenYear:
2016
Language:
english
DOI:
10.1109/CSTIC.2016.7463903
File:
PDF, 576 KB
english, 2016