[IEEE 2016 4th International Symposium on Digital Forensic...

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[IEEE 2016 4th International Symposium on Digital Forensic and Security (ISDFS) - Little Rock, AR, USA (2016.4.25-2016.4.27)] 2016 4th International Symposium on Digital Forensic and Security (ISDFS) - Control flow change in assembly as a classifier in malware analysis

Le-Khac, Nhien-An, Linke, Andree
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Year:
2016
DOI:
10.1109/ISDFS.2016.7473514
File:
PDF, 320 KB
2016
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