Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2016 / 3 Vol. 10; Iss. 2
Synergetics of catastrophic failures of semiconductor devices under high-energy ion irradiation
Oksengendler, B. L., Dzhurabekova, F. G., Maksimov, S. E., Turaev, N. Yu.Volume:
10
Language:
english
Journal:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/S1027451016020324
Date:
March, 2016
File:
PDF, 317 KB
english, 2016