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The Outward Diffusion of Sb during Nanowire Growth Studied by Quantitative High-Angle Annular Dark Field Scanning Transmission Electron Microscopy
Kauko, H., Grieb, T., Munshi, A. M., Müller, K., Rosenauer, A., Fimland, B. O., van Helvoort, A. T. J.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614002657
Date:
August, 2014
File:
PDF, 1.39 MB
english, 2014