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TFS: Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy
Dahmen, Tim, Baudoin, Jean-Pierre, Lupini, Andrew R., Kübel, Christian, Slusallek, Philipp, de Jonge, NielsVolume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614005650
Date:
August, 2014
File:
PDF, 1.41 MB
english, 2014