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Current Induced Degradation of a-Si:H Pin and Schottky Switches
Nieuwesteeg, K.J.B.M., Boogaard, J., Oversluizen, G.Volume:
258
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-258-479
Date:
January, 1992
File:
PDF, 380 KB
english, 1992