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A FIB Micro-Sampling Technique and a Site-Specific TEM Specimen Preparation Method for Precision Materials Characterization
Yaguchi, Toshie, Urao, Ryoichi, Kamino, Takeo, Ohnishi, Tsuyoshi, Hashimoto, Takahito, Umemura, Kaoru, Tomimatsu, SatoshiVolume:
636
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-636-d9.35.1
Date:
January, 2000
File:
PDF, 3.21 MB
english, 2000