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SPIE Proceedings [SPIE SPIE Commercial + Scientific Sensing and Imaging - Baltimore, Maryland, United States (Sunday 17 April 2016)] Dimensional Optical Metrology and Inspection for Practical Applications V - SLM-based tomography of phase objects using single-shot transport of intensity technique
Harding, Kevin G., Zhang, Song, Nehmetallah, George, Nguyen, Thanh C., Tran, Dat, Darudi, Ahmad, Soltani, PeymanVolume:
9868
Year:
2016
Language:
english
DOI:
10.1117/12.2220261
File:
PDF, 1.05 MB
english, 2016