Comparative Analysis of the Thermal Stress of Si and SiC...

Materials Science Forum 2016 / 5 Vol. 856

Comparative Analysis of the Thermal Stress of Si and SiC MOSFETs during Short Circuits

Kampitsis, Georgios E., Papathanassiou, Stavros A., Manias, Stefanos N.
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Volume:
856
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.856.362
Date:
May, 2016
File:
PDF, 996 KB
english, 2016
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