(Invited) Variability in FinFET SRAM Cells

ECS Transactions 2015 / 10 Vol. 69; Iss. 5

(Invited) Variability in FinFET SRAM Cells

Endo, K., O'uchi, S., Matsukawa, T., Liu, Y., Masahara, M.
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Volume:
69
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/06905.0141ecst
Date:
October, 2015
File:
PDF, 248 KB
english, 2015
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