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Corrigendum to “Measurement of the slope of transparent micro-structures using two-steps parallel phase shifting interferometry” [Optik - Int. J. Light Electron Opt. 126 (2015) 5928–5931]
López-Ortiz, B., Toto-Arellano, N.I., Muñoz, V.H. Flores, García, A. Martínez, Tellez, Y.A. CraviotoVolume:
127
Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2015.11.166
Date:
March, 2016
File:
PDF, 142 KB
english, 2016