Effect of roughness as determined by atomic force microscopy on the wetting properties of PTFE thin films
J. D. Miller, S. Veeramasuneni, J. Drelich, M. R. Yalamanchili, G. YamauchiVolume:
36
Year:
1996
Language:
english
Pages:
7
DOI:
10.1002/pen.10580
File:
PDF, 606 KB
english, 1996