Effect of roughness as determined by atomic force...

Effect of roughness as determined by atomic force microscopy on the wetting properties of PTFE thin films

J. D. Miller, S. Veeramasuneni, J. Drelich, M. R. Yalamanchili, G. Yamauchi
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Volume:
36
Year:
1996
Language:
english
Pages:
7
DOI:
10.1002/pen.10580
File:
PDF, 606 KB
english, 1996
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