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SPIE Proceedings [SPIE SPIE Defense + Security - Baltimore, Maryland, United States (Sunday 17 April 2016)] Infrared Technology and Applications XLII - Bulk growth and surface characterization of epitaxy ready cadmium zinc telluride substrates for use in IR imaging applications
Andresen, Bjørn F., Fulop, Gabor F., Hanson, Charles M., Miller, John L., Norton, Paul R., Flint, J. P., Martinez, B., Betz, T. E. M., MacKenzie, J., Kumar, F. J., Bindley, G.Volume:
9819
Year:
2016
Language:
english
DOI:
10.1117/12.2225796
File:
PDF, 707 KB
english, 2016