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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII - Noise estimation of an MTF measurement

Haefner, David P., Burks, Stephen D., Holst, Gerald C., Krapels, Keith A.
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Volume:
8355
Year:
2012
Language:
english
DOI:
10.1117/12.917723
File:
PDF, 466 KB
english, 2012
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