Intrinsic limits of channel transport hysteresis in graphene-SiO 2 interface and its dependence on graphene defect density
Krishna Bharadwaj, B, Chandrasekar, Hareesh, Nath, Digbijoy, Pratap, Rudra, Raghavan, SrinivasanVolume:
49
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/49/26/265301
Date:
July, 2016
File:
PDF, 907 KB
english, 2016