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Temperature dependent dielectric studies of Al/Dy2O3/porous Si heterostructure by capacitance and conductance measurements
Cherif, A., Jomni, S., Saghrouni, H., Belgacem, W., Khirouni, K., Beji, L.Language:
english
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2016.05.267
Date:
May, 2016
File:
PDF, 1.89 MB
english, 2016