Temperature dependent dielectric studies of Al/Dy2O3/porous...

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Temperature dependent dielectric studies of Al/Dy2O3/porous Si heterostructure by capacitance and conductance measurements

Cherif, A., Jomni, S., Saghrouni, H., Belgacem, W., Khirouni, K., Beji, L.
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Language:
english
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2016.05.267
Date:
May, 2016
File:
PDF, 1.89 MB
english, 2016
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