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[IEEE 2016 International Conference on Microelectronic Test Structures (ICMTS) - Yokohama, Japan (2016.3.28-2016.3.31)] 2016 International Conference on Microelectronic Test Structures (ICMTS) - A new write stability metric using extended write butterfly curve for yield estimation in SRAM cells at low supply voltage
Qiu, Hao, Takeuchi, Kiyoshi, Mizutani, Tomoko, Saraya, Takuya, Kobayashi, Masaharu, Hiramoto, ToshiroYear:
2016
Language:
english
DOI:
10.1109/ICMTS.2016.7476190
File:
PDF, 3.36 MB
english, 2016