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Reliability-Driven Assessment of GaN HEMTs and Si IGBTs in 3L-ANPC PV Inverters
Gurpinar, Emre, Yang, Yongheng, Iannuzzo, Francesco, Castellazzi, Alberto, Blaabjerg, FredeYear:
2016
Language:
english
Journal:
IEEE Journal of Emerging and Selected Topics in Power Electronics
DOI:
10.1109/JESTPE.2016.2566259
File:
PDF, 4.03 MB
english, 2016