[IEEE 2016 IEEE 34th VLSI Test Symposium (VTS) - Las Vegas,...

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[IEEE 2016 IEEE 34th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2016.4.25-2016.4.27)] 2016 IEEE 34th VLSI Test Symposium (VTS) - Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs

Ahmadi, Ali, Nahar, Amit, Orr, Bob, Past, Michael, Makris, Yiorgos
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Year:
2016
Language:
english
DOI:
10.1109/VTS.2016.7477263
File:
PDF, 708 KB
english, 2016
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