[IEEE 2016 IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering (SANER) - Suita, Osaka, Japan (2016.3.14-2016.3.18)] 2016 IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering (SANER) - MICHAC: Defect Prediction via Feature Selection Based on Maximal Information Coefficient with Hierarchical Agglomerative Clustering
Xu, Zhou, Xuan, Jifeng, Liu, Jin, Cui, XiaohuiYear:
2016
Language:
english
DOI:
10.1109/SANER.2016.34
File:
PDF, 268 KB
english, 2016