[IEEE 2016 17th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2016.3.15-2016.3.16)] 2016 17th International Symposium on Quality Electronic Design (ISQED) - Low capture power dictionary-based test data compression
Sismanoglou, Panagiotis, Nikolos, DimitrisYear:
2016
Language:
english
DOI:
10.1109/isqed.2016.7479216
File:
PDF, 340 KB
english, 2016