Origin of the low carrier lifetime edge zone in...

Origin of the low carrier lifetime edge zone in multicrystalline PV silicon

Tine Uberg Nærland, Lars Arnberg, Arve Holt
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Volume:
17
Year:
2009
Language:
english
Pages:
8
DOI:
10.1002/pip.876
File:
PDF, 316 KB
english, 2009
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