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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 13 February 2016)] Quantum Dots and Nanostructures: Growth, Characterization, and Modeling XIII - Crystalline phase destruction in silicon films by applied external electrical field and detected by using the laser spectroscopy
Huffaker, Diana L., Eisele, Holger, Dick, Kimberly A., Milovzorov, D. E.Volume:
9758
Year:
2016
Language:
english
DOI:
10.1117/12.2208270
File:
PDF, 735 KB
english, 2016