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SPIE Proceedings [SPIE SPIE Defense + Security - Baltimore, Maryland, United States (Sunday 17 April 2016)] Radar Sensor Technology XX - A dynamic spectrum analysis solution for the characterization of the UHF spectrum

Ranney, Kenneth I., Doerry, Armin, Pooler, Richard K., Narayanan, Ram M., Sherbondy, Kelly D., Martone, Anthony F., Gallagher, Kyle A.
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Volume:
9829
Year:
2016
Language:
english
DOI:
10.1117/12.2224482
File:
PDF, 805 KB
english, 2016
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