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SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California (Sunday 1 August 2010)] Detectors and Imaging Devices: Infrared, Focal Plane, Single Photon - Thinning of PLZT ceramic wafers for sensor integration
Dereniak, Eustace L., Jin, Na, Liu, Weiguo, Hartke, John P., LeVan, Paul D., Sood, Ashok K., Longshore, Randolph E., Razeghi, ManijehVolume:
7780
Year:
2010
Language:
english
DOI:
10.1117/12.858610
File:
PDF, 217 KB
english, 2010