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Structural, morphological and spectroscopic ellipsometry studies on sputter deposited Sb2S3 thin films
Medina-Montes, M. I., Montiel-González, Z., Paraguay-Delgado, F., Mathews, N. R., Mathew, X.Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-016-5033-0
Date:
May, 2016
File:
PDF, 1.47 MB
english, 2016