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A symmetrical stretching stage for electrical atomic force microscopy
Wielgoszewski, Grzegorz, Moczała, Magdalena, Orłowska, Karolina, Sówka, Piotr, Cao, Wenzhe, Wagner, Sigurd, Gotszalk, TeodorVolume:
87
Language:
english
Journal:
Measurement
DOI:
10.1016/j.measurement.2016.03.031
Date:
June, 2016
File:
PDF, 1.27 MB
english, 2016