Thermal Boundary Resistance in GaN Films Measured by Time...

Nanoscale and Microscale Thermophysical Engineering 2016 / 01 Vol. 20; Iss. 1

Thermal Boundary Resistance in GaN Films Measured by Time Domain Thermoreflectance with Robust Monte Carlo Uncertainty Estimation

Bougher, Thomas L., Yates, Luke, Lo, Chien-Fong, Johnson, Wayne, Graham, Samuel, Cola, Baratunde A.
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Volume:
20
Language:
english
Journal:
Nanoscale and Microscale Thermophysical Engineering
DOI:
10.1080/15567265.2016.1154630
Date:
January, 2016
File:
PDF, 1.07 MB
english, 2016
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