Identifying Performance Limiting Defects in Silicon Carbide...

Identifying Performance Limiting Defects in Silicon Carbide pn-Junctions: A Theoretical Study

Cottom, Jonathon, Gruber, Gernot, Pobegen, Gregor, Aichinger, Thomas, Shluger, Alexander L.
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Volume:
858
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.858.257
Date:
May, 2016
File:
PDF, 419 KB
english, 2016
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